Máy đo chiều dày lớp sơn, mạ QNIx series Densoku

More easily the film thickness measurement was a cumbersome
portable film thickness meter to production efficiency up

Without carrying a heavy film thickness meter, products that can be only at a film thickness measuring ultra-lightweight compact instrument and probe, it is QNIx series.
No cable by radio measurement. After also transfer of measurement data to a PC is easy, and also contribute to the fall accident prevention during the measurement.


Features of QNIx series

It enables accurate film thickness measurement without the film calibration

Delivery by entering the calibration data of 16Point at the factory. As a result, the troublesome film calibration work is no longer required, and the exact thickness can be measured.

New technology of film thickness measurement data transfer

The traditional instrument, the instrument body and the personal computer had to transfer the connection measurement data in the cable. QNIx series use a "wireless Dongle" to be transferred just plug into a USB port. Measurement data more quickly, can be viewed comfortably.

Wireless measuring instrument of ultra-lightweight

Data measured by the probe is transmitted to the main body wirelessly. Or getting in the way or caught in the cable as the conventional product, the risk that leads to fall accident mitigation. In addition, the weight of the probe is an ultra light weight of 30g, and you do not need to carry around a heavy instrument.

Probe that does not leave a trace in hard to break the measurement object

QNIx series of probes durability 3 percent up surrounded by a reinforced plastic. For decomposition and repair it is easy even if you have any chance failure, also shorten repair period. In addition, ruby ​​chip and is installed, you can safely measure without damaging the measurement object (sample).

QNIx series comparison Specifications Table

	QNIx 8500	QNIx  4500/4200	QNIx 7500	QNIx Carcheck System	QNIx Handy
Measurable film	[F] non-magnetic coating on the iron material [N] non-conductive coatings on non-ferrous material [FN] non-magnetic, non-conductive coating on the iron and non-ferrous material			[FN] non-magnetic, non-conductive coating on the iron and non-ferrous material	[FN] non-magnetic, non-conductive film thickness on the iron-aluminum material
Material recognition	Iron and non-ferrous material  automatic recognition exchange	Iron and non-ferrous material automatic recognition exchange	User specified conversion	Iron and non-ferrous material automatic recognition exchange	Iron and non-ferrous, automatic recognition mode conversion
Measurement principle	[F] magnetic flux (Hall-Effect) [N] eddy current (Eddy-Current)
Measurement range	～ 2,000Myuemu 0  (Optional: 5,000μm)	0 ~ 3,000μm	～ 2,000Myuemu 0  (Optional: 5,000μm)	0 ~ 5,000μm	0 ~ 500μm
The maximum  resolution	0.1μm, 1μm [M]0.01μm	1μm	0.1μm	0.1μm, 1μm	5μm
Configuration format	0 point correction User calibration: 1 [M] 100	0-point correction	0-point correction	No calibration function	No calibration function
accuracy	± (1Myuemu Tasu 2 Pasento)  ± 3.5 Pasento  (more than 2mm) [T] ±(0.3Myuemu Tasu 2 Pasento)	± (2μm + 3%)	± (1μm + 3%)	± (1Myuemu Tasu 2 Pasento) ± 3.5 Pasento  (more than 2mm)	± (10μm + 5%)
Measuring speed	1,500Ms  (about 40 times / min) [T] 920Ms(about 65 times / min) [R] 1,600Ms(about 37 times / min)	600Ms  (about 70 times / min)	1,300Ms  (about 46 times / min)	1,500Ms  (about 40 times / min)	600Ms  (about 100 times / min)

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